ASAP Semiconductor appreciates your request for quotation sent via JetParts360.com for part number SN54S287W made by Manufacturer Texas Instruments Incorporated with it's corresponding NSN 5962010758004, CAGE Code 01295 and FSC 5962 Microcircuits Electronic. This SN54S287W part is described as Microcircuit Memory. You can expect a response from a dedicated customer service expert from ASAP Semiconductor within 15 minutes. Each RFQ is answered in the order it was received. We request you to fill out your contact information, as well as quantity, and any target price along with an expected delivery date for SN54S287W part. We will strive to provide you with an aggressive price to earn the opportunity for your business.
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5962-01-075-8004, 5962010758004 Characteristics Data
MRC
Criteria
Characteristic
ADAQ
BODY LENGTH
0 440 INCHES MAXIMUM
ADAT
BODY WIDTH
0 240 INCHES MINIMUM AND 0 325 INCHES MAXIMUM
ADAU
BODY HEIGHT
0 085 INCHES MAXIMUM
AFGA
OPERATING TEMP RANGE
-55 0125 0 DEG CELSIUS
AFJQ
STORAGE TEMP RANGE
-65 0150 0 DEG CELSIUS
CBBL
FEATURES PROVIDED
HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND WSTORAGE AND PROGRAMMED AND SCHOTTKY AND BIPOLAR AND 3-STATE OUTPUT
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
FLAT PACK
CQWX
OUTPUT LOGIC FORM
TRANSISTOR-TRANSISTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
10 INPUT
CWSG
TERMINAL SURFACE TREATMENT
SOLDER
CZEN
VOLTAGE RATING AND TYPE PER CHARACTERISTIC
5 5 VOLTS MAXIMUM POWER SOURCE
CZEQ
TIME RATING PER CHACTERISTIC
5 00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 35 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 10 00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME HIGH TO LOW LEVEL OUTPUT AND 89 0
CZER
MEMORY DEVICE TYPE
ROM
TEST
TEST DATA DOCUMENT
82577-932820 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC
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